IEC 60749-37-2008 半导体装置.机械和气候试验方法.第37部分:用加速计的电路板级落锤试验方法
作者:标准资料网 时间:2024-05-12 20:27:13 浏览:9997
来源:标准资料网
下载地址: 点击此处下载
【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part37:Boardleveldroptestmethodusinganaccelerometer
【原文标准名称】:半导体装置.机械和气候试验方法.第37部分:用加速计的电路板级落锤试验方法
【标准号】:IEC60749-37-2008
【标准状态】:现行
【国别】:国际
【发布日期】:2008-01
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:加速计;应用;壳体;气候的;气候试验;部件;定义;跌落试验;电气工程;电子的;电子设备及元件;失败分析;失败标准;仪器;力学;机械测试;印制电路板;半导体器件;半导体;测试
【英文主题词】:Accelerationmeasuringinstruments;Accelerometers;Applications;Bodies;Climatic;Climatictests;Components;Definitions;Design;Droptests;Electricalengineering;Electronic;Electronicequipmentandcomponents;Failureanalysis;Failurecriterion;Instruments;Mechanic;Mechanicaltesting;Printed-circuitboards;Semiconductordevices;Semiconductors;Standardizations;Testing
【摘要】:ThispartofIEC60749providesatestmethodthatisintendedtoevaluateandcomparedropperformanceofsurfacemountelectroniccomponentsforhandheldelectronicproductapplicationsinanacceleratedtestenvironment,whereexcessiveflexureofacircuitboardcausesproductfailure.Thepurposeistostandardizethetestboardandtestmethodologytoprovideareproducibleassessmentofthedroptestperformanceofsurface-mountedcomponentswhileproducingthesamefailuremodesnormallyobservedduringproductleveltest.Thepurposeofthisstandardistoprescribeastandardizedtestmethodandreportingprocedure.Thisisnotacomponentqualificationtestandisnotmeanttoreplaceanysystemleveldroptestthatmaybeneededtoqualifyaspecifichandheldelectronicproduct.ThestandardisnotmeanttocoverthedroptestrequiredtosimulateshippingandhandlingrelatedshockofelectroniccomponentsorPCBassemblies.TheserequirementsarealreadyaddressedintestmethodssuchasIEC60749-10.Themethodisapplicabletobothareaarrayandperimeter-leadedsurfacemountedpackages.Thistestmethodusesanaccelerometertomeasurethemechanicalshockdurationandmagnitudeappliedwhichisproportionaltothestressonagivencomponentmountedonastandardboard.ThetestmethoddescribedinthefutureIEC60749-401usesstraingaugetomeasurethestrainandstrainrateofaboardinthevicinityofacomponent.Thedetailedspecificationstateswhichtestmethodistobeused.
【中国标准分类号】:L30
【国际标准分类号】:31_080_01
【页数】:39P;A4
【正文语种】:英语
【原文标准名称】:半导体装置.机械和气候试验方法.第37部分:用加速计的电路板级落锤试验方法
【标准号】:IEC60749-37-2008
【标准状态】:现行
【国别】:国际
【发布日期】:2008-01
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:加速计;应用;壳体;气候的;气候试验;部件;定义;跌落试验;电气工程;电子的;电子设备及元件;失败分析;失败标准;仪器;力学;机械测试;印制电路板;半导体器件;半导体;测试
【英文主题词】:Accelerationmeasuringinstruments;Accelerometers;Applications;Bodies;Climatic;Climatictests;Components;Definitions;Design;Droptests;Electricalengineering;Electronic;Electronicequipmentandcomponents;Failureanalysis;Failurecriterion;Instruments;Mechanic;Mechanicaltesting;Printed-circuitboards;Semiconductordevices;Semiconductors;Standardizations;Testing
【摘要】:ThispartofIEC60749providesatestmethodthatisintendedtoevaluateandcomparedropperformanceofsurfacemountelectroniccomponentsforhandheldelectronicproductapplicationsinanacceleratedtestenvironment,whereexcessiveflexureofacircuitboardcausesproductfailure.Thepurposeistostandardizethetestboardandtestmethodologytoprovideareproducibleassessmentofthedroptestperformanceofsurface-mountedcomponentswhileproducingthesamefailuremodesnormallyobservedduringproductleveltest.Thepurposeofthisstandardistoprescribeastandardizedtestmethodandreportingprocedure.Thisisnotacomponentqualificationtestandisnotmeanttoreplaceanysystemleveldroptestthatmaybeneededtoqualifyaspecifichandheldelectronicproduct.ThestandardisnotmeanttocoverthedroptestrequiredtosimulateshippingandhandlingrelatedshockofelectroniccomponentsorPCBassemblies.TheserequirementsarealreadyaddressedintestmethodssuchasIEC60749-10.Themethodisapplicabletobothareaarrayandperimeter-leadedsurfacemountedpackages.Thistestmethodusesanaccelerometertomeasurethemechanicalshockdurationandmagnitudeappliedwhichisproportionaltothestressonagivencomponentmountedonastandardboard.ThetestmethoddescribedinthefutureIEC60749-401usesstraingaugetomeasurethestrainandstrainrateofaboardinthevicinityofacomponent.Thedetailedspecificationstateswhichtestmethodistobeused.
【中国标准分类号】:L30
【国际标准分类号】:31_080_01
【页数】:39P;A4
【正文语种】:英语
下载地址: 点击此处下载